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10 |
Electrical Characteristics |
10.1 |
General electrical testing specifications |
10.1.1 | Test sequence |
Here the test sequence of electrical tests can be defined.
10.1.2 | Function states |
The <function-state> describes the effect upon a system during and after the exposure to an interference. Function states have initially been defined in order to evaluate electromagnetic compatibility and electrical immunity.
A function state is expressed by a capital letter (key) and a description of the state.
Figure 13: Functions State Description
Function states |
Description |
---|---|
A |
Device works within the given tolerances |
B |
Device works, but not within the given tolerances, and returns after decay of the interference to function state A |
C |
Device does not work or works defectively, but returns after decay of the interference automatically to function state A |
D |
Device does not work or works defectively and stays after decay of the interference outside the given tolerances |
E |
Device does not accomplish one ore more functions during and after the exposure to the interference and has to be repaired or substituted after the exposure to the interference |
10.2 |
Power supply |
10.2.1 | Voltages |
Concerning voltages, various nominal voltages (<nominal-volt>) can be specified. It is possible to reference to supply connections with the reference mechanism. In the description of the supply connections, any number of voltage ranges with respective operating states can be given to each nominal voltage. Various operating states can be assigned to a voltage range.
Figure 15: Structure of voltages
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Nominal voltage |
UN |
12 |
V |
1 |
10.2.2 | Currents |
Concerning currents, various nominal currents (<nominal-current>) can be specified. It is possible to reference to supply connections with the reference mechanism. In the description of the supply connections, any number of current ranges with respective operating states can be given to each nominal current. Various operating states can be assigned to a current range.
Figure 16: Structure of currents
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
IN |
2 |
A |
1 |
10.2.3 | Powers |
Concerning powers, various nominal powers (<nominal-power>) can be specified. It is possible to reference to supply connections with the reference mechanism. In the description of the supply connections, any number of power ranges with respective operating states can be given to each nominal power. Various operating states can be assigned to a power range.
Figure 17: Structure of powers
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Nominal power |
PN |
10 |
W |
1 |
10.2.4 | Further properties |
In the topic further properties properties are described, which ought to be described in the topic range of <power-supply> but which cannot be expressed thematically in any of the subdivision points mentioned above (see Concepts of the MSR application profile V1.x.x)
10.3 |
Electrical immunity |
10.3.1 | Reverse polarity protection |
Reverse polarity protection describes the behaviour (function state and admissible fault descriptions) of the system in case of permanent reverse polarity of the battery connection. The reverse polarity is defined by the reverse polarity voltage (<test-volt>), reverse polarity time (<test-duration>) and testing temperature (<test-temp>). Furthermore, the general design of the system or component interfaces is defined, e.g. the treatment of the interfaces which have a connection to ground or to the supply voltage outside the system, the protection of the connected components, the state of the outputs during reverse polarity, etc.
The description of the reverse polarity protection is valid for all electrical connections (there is no reference to any electrical connection). If there are different descriptions for some electrical connections, a further description of the reverse polarity protection is defined for each difference (with reference to the concerned connection).
In addition to the a.m. statements there can always be given additional specifications, e.g. the test set-up.
Figure 19: Structure of reverse polarity protection
test
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Test voltage |
UP |
15,0 |
V |
|||||
Test duration |
tP |
19 |
20 |
21 |
s |
|||
Test temperature |
T |
17 |
22 |
27 |
C |
Operating state : switched off
Function state: B
Fault description: Output C2 activated
10.3.2 | Overvoltage strength |
The overvoltage strength describes the behaviour of the system in case of overvoltage regarding supply connections, which can be created by a jump start, e.g. The voltage wave form (<overvoltage-res-prms>, in the most simple way defined by corresponding voltage and time specifications), the operating state (<oper-mode-refs>), the function state (<fuction-state-ref>), and the fault description (<failure-desc>) can be defined. By defining various overvoltage strength tests, a number of different requirements, e.g. static overvoltage, jump start, boost charge etc. can be defined.
The description of the overvoltage strength is valid for all electrical connections (there is no reference to any electrical connection). If there are different descriptions for some electrical connections, a further description of the overvoltage strength is defined for each difference (with reference to the concerned connection).
In addition to the a.m. statements there can always be given additional specifications, e.g. the test set-up.
Figure 20: Structure of overvoltage strength test
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Overvoltage |
U |
30 |
V |
1 |
||||
Test duration |
tP |
19 |
20 |
21 |
s |
|||
Test voltage |
UP |
15,0 |
V |
|||||
Test temperature |
T |
17 |
22 |
27 |
°C |
|||
Number of tests |
n |
5 |
||||||
Interval between tests |
t |
10 |
s |
Figure 21: Voltage
characteristics
Operating state : starting phase
Function state: B
Fault description: Output C2 activated
10.3.3 | Short-circuit strength |
The short-circuit strength describes the function state of the system in case of a clamp being held to ground or supply voltage thus producing a short-circuit. The short-circuit strength will be defined generally for all interfaces. Furthermore, depart from this specification the short-circuit strength can be defined for each connection regarding the description of interfaces.
The description of the short-circuit strength is valid for all electrical connections (there is no reference to any electrical connection). If there are different descriptions for some electrical connections, a further description of the short-circuit strength is defined for each difference (with reference to the concerned connection).
The MSR group defined the following description of the short-circuit strength:
Figure 22: Structure of short-circuit strength
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Test voltage |
UP |
15,0 |
V |
|||||
Test temperature |
T |
17 |
22 |
27 |
°C |
|||
Test duration |
tP |
19 |
20 |
21 |
s |
|||
Short circuit current |
IKS |
10 |
A |
|||||
Short circuit resistance |
RKS |
0.01 |
W |
|||||
Short circuit inductivity |
LKS |
0.01 |
µH |
|||||
Number of tests |
n |
5 |
||||||
Interval between tests |
t |
10 |
s |
Operating state : starting phase
Function state: B
Fault description: fuse cuts out
In addition to the a.m. statements there can always be given additional specifications, e.g. the test set-up.
10.3.4 | Overload strength |
The overload strength is an overload of the outputs (consumers use more than nominal current). Overload strength is defined generally for all interfaces. Furthermore, depart from this specification the overload strength can be defined for each connection regarding the description of interfaces.
The description of the overload strength is valid for all electrical connections (there is no reference to any electrical connection). If there are different descriptions for some electrical connections, a further description of the overload strength is defined for each difference (with reference to the concerned connection).
The MSR group defined the following description of the overload strength:
Figure 23: Structure of overload strength
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Overload |
Ü |
5 |
15 |
A |
||||
Test duration |
tP |
19 |
20 |
21 |
s |
|||
Test voltage |
UP |
15,0 |
V |
|||||
Test temperature |
T |
17 |
22 |
27 |
°C |
|||
Number of tests |
n |
5 |
||||||
Interval between tests |
t |
10 |
s |
Operating state : starting phase
Function state: B
Fault description: fuse cuts out
In addition to the a.m. statements there can always be given additional specifications, e.g. the test set-up.
10.3.5 | Insulating resistance |
The insulating resistance is determined between two electrically separated connections or between the casing and the electrically separated connections. The determination of the resistance is realized with an unconnected device under test (DUT) by a relatively high direct current. Furthermore, relevant quantities for the determination of the insulating resistance can be given, e.g. temperature (<test-temp>), <test-duration>, relative humidity (<relative-hum>).
The description of the insulating resistance is valid for all electrical connections (there is no reference to any electrical connection). If there are different descriptions for some electrical connections, a further description of the insulating resistance is defined for each difference (with reference to the concerned connection).
Figure 24: Structure of insulating resistance
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Voltage |
US |
450 |
500 |
550 |
V |
|||
Test duration |
tP |
0,95 |
1 |
1,05 |
min |
|||
Temperature |
TP |
1,9 |
2 |
2,1 |
°C |
|||
Resistance |
R |
1 |
MW |
|||||
rel. humidity |
hum |
67,5 |
75 |
82,5 |
% |
Besides the measuring voltage and the resistance, there can always be given additional specifications for each test, e.g. the test set-up.
10.3.6 | Dielectric strength |
The dielectric strength is determined between two electrically separated connections or between the casing and the electrically separated connections, by applying an alternating voltage.
The description of the dielectric strength is valid for all electrical connections (there is no reference to any electrical connection). If there are different descriptions for some electrical connections, a further description of the dielectric strength is defined for each difference (with reference to the concerned connection).
Figure 25: Structure of dielectric strength
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Voltage |
US |
450 |
500 |
550 |
V |
|||
Temperature |
TP |
17 |
22 |
27 |
°C |
|||
Test duration |
tP |
0,95 |
1 |
1,05 |
min |
|||
Frequency |
f |
50 |
Hz |
|||||
rel. humidity |
hum |
67,5 |
75 |
82,5 |
% |
Besides the measuring voltage and the frequency, there can always be given additional specifications for each test, e.g. the test set-up.
10.3.7 | Voltage mismatch |
The voltage mismatch describes the ability of a component, or a system, to accomplish its specified function in case of a voltage mismatch in the ground conduction or power supply. The voltage mismatch can be caused by an external connection of sensors or actuators to the ground conduction or to the power supply (e.g. use of the car body as ground conduction). A max. admissible voltage mismatch can be defined, for the ground connection as well as for the power supply, with the aid of the reference point.
The description of the voltage mismatch is valid for all electrical connections (there is no reference to any electrical connection). If there are different descriptions for some electrical connections, a further description of the voltage mismatch is defined for each difference (with reference to the concerned connection).
Besides the measuring voltage and the test duration, there can always be given additional specifications for each test, e.g. the test set-up.
Figure 26: Structure of voltage mismatch
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
pos. voltage mismatch |
dU |
0,8 |
1 |
1,2 |
V |
|||
neg. voltage mismatch |
dU |
0,8 |
1 |
1,2 |
V |
|||
Test duration |
tP |
0,95 |
1 |
1,05 |
min |
Operating state : switched on
Function state: A
10.3.8 | Further properties |
In the subdivision point <add-spec> properties are described which ought to be mentioned in the topic area of Electrical immunity (<elec-immunity>) but which cannot be expressed thematically in any of the subdivision points mentioned above.
Figure 27: Structure of further properties
10.4 |
Electromagnetic compatibility (EMC) |
Electromagnetic compatibility is the ability of an equipment or system to function satisfactorily within its electromagnetic environment without introducing intolerable electromagnetic disturbance to anything in that environment. ([Standard: DIN 40 839-1 / Relevant Position: 2.1]).
10.4.1 | Interferences by conduction |
<inter-con>
Figure 29: Structure of interferences by conduction
10.4.1.1 | Interference strength |
<inter-immunity>
Figure 30: Structure of interference strength
Within the interference strength, interferences by conduction in power supply conductions (<inter-supply-con>), coupled-in interferences on transmission and sensor conductions (<inter-signal-con>) as well as vehicle network ripple (<waved-nominal-volt>) are considered. The standard [Standard: DIN 40 839-1 / Relevant Position: 3]forms the basis for interference strength (not including vehicle network ripple).
10.4.1.1.1 | Interferences by conduction in power supply conductions |
<inter-supply-con>
Figure 31: Structure of interference via power
supply
10.4.1.1.1.1 | Laboratory tests |
The requirements on interferences by conduction in power supply conductions (<inter-supply-con>) are described for one (or possibly more) vehicle network voltage(s) by means of interference strength tests.
During an interference strength test, the behaviour of a DUT is tested by submitting the sample to a test pulse. Regarding interference strength test, the following specifications can be made.
Test pulse The test pulse can be defined including all corresponding parameter values (...t1 to ... td). (as given in the definition,Representation example for test pulses for a 12 V vehicle network (according to DIN 40839 part 1).). |
Severity level and correlated peak voltage for the test pulse Severity levels, defined in Determination of severity levels for test pulses by means of pulse amplitudes according to DIN 40839 part 1 can be chosen. The specification of the severity level will only be required in case of standardized test pulses. |
Test voltage Vehicle network voltage applied during the test. Only defined if it deviates from the standard test voltage. |
Internal resistance of the generator Ri Internal resistance of the interference source |
Minimum test amount The minimum test amount is defined by the number of test pulses or by the duration of the test. |
Intervals between test pulses The intervals between test pulses have to be defined only for those test pulses for which there are not given any specifications in the standard. This is especially true for test pulse 5. |
Interference source The test device which generates the test pulse. |
Operating state The operating state defines the state of the system at which the test is performed. If the test is to be performed with various operating states, they can be grouped. |
Function state The assignment of a function state to the test is accomplished by a code letter (A...E). |
Fault description The failure mode of the system will be described in textual form, in addition to the function state (if it is not equal to A). |
Additional specifications Apart from the a.m. specifications, it is always possible to give additional specifications for a test. These include, e.g., a test temperature which differs from general specifications, the test set-up and further specifications which have not been defined yet. |
The content of interference strength tests is not established in an (inter-)national standard. Apart from the test pulses 1 to 5, descriptions concerning interferences by conduction in power supply conductions (<inter-supply-con>) can be filed either in a user-defined way or according to in-house standards.
This includes, e.g., the test of the central load-dump protection with a characteristic that differs from test pulse 5, or the definition of the behaviour in case of a determined voltage characteristic in the power supply conductions.
The voltage characteristic describes the robustness of the system/the component against defined voltage changes, which may arise due to the failure of a generator or a defective vehicle battery. The voltage characteristic can be defined in form of a text or a graphic.
Figure 32: Structure of laboratory test
Example for content:
Denomination |
Abbreviation |
Min |
Type |
Max |
Tolerance |
Unit |
||
---|---|---|---|---|---|---|---|---|
Severity level |
4 |
|||||||
Peak voltage |
Us |
-100 |
V |
|||||
Test- spg. |
Up |
13.5 |
V |
|||||
Internal resistance of generator |
Ri |
10 |
Ohm |
|||||
Minimum test amount |
30000 |
|||||||
Intervals between test pulses |
Interference source: test pulse generator NSG 500C
Operating state : switched on
Function state: A
Fault description: no fault
Additional specifications: Pulse generated by switching off inductive charges.
Denomination |
Abbreviation |
Min |
Type |
Max |
Tolerance |
Unit |
||
---|---|---|---|---|---|---|---|---|
Intervals between pulses |
t1 |
0.5 |
5 |
s |
||||
Duration of individual interference |
t2 |
200 |
ms |
|||||
Recovery time, duration between interference end and interference start |
t3 |
100 |
µs |
|||||
Pulse rise time |
tr |
1 |
ms |
|||||
Pulse duration |
td |
2 |
ms |
Test pulse: 2
...(Description as for test pulse 1)
Definition of the test pulse
A test pulse is described by a curve which is characterized by specific parameters. The shape of the curve depends on the vehicle network voltage.
According to [Standard: DIN 40 839-1 / Relevant Position: all]5 different test pulses (test pulse forms) are described with the help of corresponding parameter values which additionally depend on the vehicle network voltage:
1. | Pulse generated by disconnecting inductive loads. |
2. | Pulse generated by direct current motors when disconnecting. |
3. | Pulse generated by switching. There is a difference between 3a (negative peak voltage) and 3b (positive peak voltage) |
4. | Pulse generated by closing the starter circuit in combustion engines. The ripple produced by the revolutions of the starter is not considered. |
5. | Pulse generated, among other facts, by disconnecting the battery when the generator produces charge current (battery charge current disconnection pulse). |
test pulse |
Ua |
t1 |
t2 |
t3 |
t4 |
t5 |
t6 |
t7 |
t8 |
tf |
tr |
td |
V |
s |
ms |
µs |
ms |
ms |
ms |
ms |
s |
ms |
ms |
ms |
|
1 |
0,5-5 |
200 |
µ100 |
1µs |
2 |
|||||||
2 |
0,5-5 |
200 |
1µs |
0.05 |
||||||||
3a |
100µs |
10 |
90 |
5ns |
0.1µs |
|||||||
3b |
100µs |
10 |
90 |
5ns |
0.1µs |
|||||||
4 |
-2.5 |
15 |
50 |
0.5-20 |
100 |
5 |
||||||
5 |
0.1-10 |
40-400 |
Significance of parameters:
t1: Interval between pulses
t2: Duration of single interference
t3: Recovery time, duration between end of interference and beginning of interference
t4: Duration of switching burst
t5: Recovery time
t6: Duration of peak voltage drop Us
t7: Rise time from Us to Ua
t8: Duration of Ua
tf: Rise time operation voltage
tr: Pulse rise time
td: Duration of pulse
Ua: Voltage drop after transient state with reference to test voltage Up
Not all given parameters are used for the description of a test pulse.
Further user-defined or in-house standard specific test pulses can be given.
Definition of the severity level
The severity level determines the peak voltage Us of the test pulse.
According to DIN 40 839-1the following severity levels are defined:
Test pulse |
Pulse amplitude U s in volts at severity level (for vehicle network voltage of 12/24V) |
|||
---|---|---|---|---|
I |
II |
III |
IV |
|
1 |
-25/-50 |
- 50/-100 |
- 75/-150 |
-100/-200 |
2 |
+ 25 |
+ 50 |
+ 75 |
+ 100 |
3a |
-25/-35 |
-50/-70 |
-100/-140 |
-150/-200 |
3b |
+25/35 |
+50/70 |
+75/140 |
+100/200 |
4 |
-4/-5 |
-5/-10 |
-6/-14 |
-7/-16 |
5 |
+26,5/70 |
+46,5/113 |
+66,5/156 |
+86,5/200 |
The peak voltage depends on the severity level and on the vehicle network voltage. Further user-defined or in-house standard specific severity levels with corresponding voltages U s can be defined for given test pulses.
10.4.1.1.1.2 | Test in vehicle |
<inter-supply-con-vehicle-test>
During the test in vehicle the built-in component is exposed to interferences which are originated by switching known interference sources in the wiring harness. Following specifications can be made for the description of the test:
Test pulse Contrary to the laboratory tests (<inter-supply-con-lab-test>), here pulses generated by known interference sources in the vehicle are coupled into. These are characteristic pulses which correspond the pulses 1 to 5 (see table Representation example for interference strength requirements: concerning interferences by conduction in power supply conductions, test pulse 1). If the test pulse is described by detailed parameters, an adaptation of the parameter values corresponding to the test pulse, to the pulses actually existing in the vehicle is possible. |
Severity level and corresponding peak voltage for the test pulse. Severity levels defined in [Determination of severity levels for test pulses by means of pulse amplitudes according to DIN 40839 part 1] can be chosen. The specification of the severity level is only required in case of standard pulses. |
Test voltage Vehicle network voltage applied during the test. It will only be defined if it deviates from the standard test voltage. |
Minimum test amount The minimum test amount is defined by the number of test pulses or by the duration of the test. |
Interference source The known component which generates the test pulse. |
Operating state The operating state defines the state of the system at which the test is performed. If the test is to be performed with various operating states, these can be grouped. |
Function state The assignment of a function state to the test is accomplished by a code letter (A...E). |
Fault description The failure mode of the system will be described in textual form, in addition to the function state (if it is not equal to A). |
Additional specifications Apart from the a.m. specifications, it is always possible to give additional specifications for a test. These include, e.g., a test temperature which differs from general specifications, the test set-up and further specifications which have not been defined yet. |
Example for content:
See example in chapter Laboratory tests.
10.4.1.1.2 | Coupled-in interferences on transmission and sensor conductions |
<inter-signal-con>
Figure 34: Structure of coupled-in interferences
10.4.1.1.3 | Laboratory tests |
The requirements to capacitively coupled-in interferences are described in an analogue way to the requirements to interferences by conduction in power supply conductions (<inter-supply-con>). The pulses used within that correspond, concerning their characteristics, to the pulses used in Interferences by conduction in power supply conductions (<inter-supply-con>). Although, because of the origin of these pulses, they are not the same pulses. In order to realize a capacitive coupling of an interference into the interference sink, the coupling clamp is used.
Apart from the test pulses defined by standards, it is possible to define further test pulses (e.g. company-specific test pulses).
The requirements to interferences which can be coupled into signal input conductions, data conductions, and control conductions, as well as into output conductions, are described to one or various corresponding vehicle network voltage(s) by means of interference strength tests. During an interference strength test, the behaviour of a DUT is tested by exposing the sample to a test pulse. For an interference strength test, following specifications can be made.
Test pulse Characteristic test pulses, which are described in Representation example for test pulses for coupled-in interferences on transmission and sensor conductions and a 12 volts vehicle network, can be chosen. If the test pulse is described by detailed parameters, an adaptation of the parameter values corresponding to the test pulse, to the pulses actually existing in the vehicle is possible. |
Severity level and corresponding peak voltage for the test pulse Severity levels defined in Determination of severity levels for coupled-in interferences on transmission and sensor conductions according to DIN 40839 part 3., can be chosen. The specification of the severity level is only required in case of standard pulses. |
Test voltage Vehicle network voltage applied during the test. It will only be defined if it deviates from the standard test voltage. |
Internal resistance of the generator Ri Internal resistance of the interference source |
Minimum test amount The minimum test amount is defined by the number of test pulses or by the duration of the test. |
Interference source The known component which generates the test pulse. |
Operating state The operating state defines the state of the system at which the test is performed. If the test is to be performed with various operating states, these can be grouped. |
Function state The assignment of a function state to the test is accomplished by a code letter (A...E). |
Fault description The failure mode of the system will be described in textual form, in addition to the function state (if it is not equal to A). |
Additional specifications Apart from the a.m. specifications, it is always possible to give additional specifications for a test. These include, e.g., a test temperature which differs from general specifications, the test set-up, the description of the coupling clamp and further specifications which have not been defined yet. |
Example for content:
See example in chapter Laboratory tests.
Test pulse |
t1 |
t2 |
t3 |
tr |
td |
Unit |
s |
ms |
ms |
µs |
ms |
1 |
0,5 -5 |
1 |
2 |
||
2 |
0,5 -5 |
1 |
|||
3a |
0,0001 |
10 |
90 |
0,005 |
0,0001 |
3b |
0,0001 |
10 |
90 |
0,005 |
0,0001 |
new |
Test pulse |
Pulse amplitude U s in volts at severity level (for 12/24V vehicle network voltage) |
|||
---|---|---|---|---|
I |
II |
III |
IV |
|
1 |
-7.5/-15 |
-15/-30 |
-22.5/-45 |
-30/-60 |
2 |
7.5/15 |
15/30 |
22.5/45 |
30/60 |
3a |
-15/-14 |
-30/-28 |
-45/-56 |
-60/-80 |
3b |
10/14 |
20/28 |
30/56 |
40/80 |
The peak voltage depends on the severity level and on the vehicle network voltage. Further user-defined or in-house standard specific severity levels with corresponding voltages U s can be defined to given test pulses.
10.4.1.1.4 | Test in vehicle |
<inter-signal-con-vehicle-test>
During the test in vehicle the built-in component is exposed to interferences which are originated by switching known interference sources in the wiring harness. Following specifications can be made for the description of the test:
Minimum test amount The minimum test amount is defined by the duration of the test. |
Function state (<function-state-ref>) The assignment of a function state to the test is accomplished by a code letter (A...E). |
Fault description (<failure desc>) The failure mode of the system will be described in textual form, in addition to the function state (if it is not equal to A). |
Example for content:
See example in chapter Laboratory tests.
10.4.1.2 | Vehicle network ripple |
Requirements concerning the vehicle network ripple define the robustness of a DUT with respect to the vehicle network ripple originated by the generator. It is assumed that the interference originated by the generator, which interferes the supply voltage, is sinusoidal. Since the generator, which is coupled to the vehicle engine, works within a wide range of revolutions, the interference strength is defined for a frequency range and for a frequency response curve. The frequency response curve determines the form of the frequency changes, e.g., ramp, sawtooth etc., within the specified test duration. This requirement can be described by the following parameters.
Figure 37: Structure of vehicle network ripple
Example for content:
Figure 38: Frequency response
curve
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tolerance |
Unit |
|
---|---|---|---|---|---|---|---|---|
Interference voltage |
US |
1,9 |
2 |
2,1 |
V |
|||
Internal resistance |
RI |
0.2 |
W |
|||||
Test duration |
t |
9 |
10 |
11 |
min |
Operating state : Switched on
Function state: A
Fault description: no fault
Additional specifications:
Apart from the a.m. specifications, it is always possible to give additional specifications for a test. These include, e.g., a test temperature which differs from general specifications, the test set-up etc.
10.4.2 | Interference emission |
Within the interference emission, interferences by conduction in power supply conductions (<inter-supply-con>), which are emitted from the devices, are measured. The base forms the standard DIN 40 839-1.
Figure 39: Structure of interference emission
10.4.2.1 | Laboratory tests |
An interference emission is an interference emitted by the DUT onto the artificial network. In order to evaluate the emission of interferences by equipment in the laboratory, the DUT is connected to an artificial network, and put into operation. The following specifications can be given for an interference emission test.
Test pulse Characteristic test pulses as defined in table [Test pulses for the description of the interference emission according to DIN 40839 part 1] can be chosen. If the test pulse is described by detailed parameters, an adaptation of the parameter values corresponding to the test pulse to the pulses actually existing in the vehicle is possible. |
Severity level and corresponding peak voltage for the test pulse Severity levels defined in [Determination of interferences emission grades for characteristic pulses via admissible pulse amplitudes according to DIN 40839 part 1] can be chosen. The specification of the severity level is only required in case of standard pulses. |
Vehicle network voltage applied during the test. It will only be defined if it deviates from the standard test voltage. |
Equivalent resistance RS (<substitute-res>) The compensating resistance simulates the direct current resistance of consumers which cannot be switched off in the vehicle network. |
Example for content:
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tolerance |
Unit |
|
---|---|---|---|---|---|---|---|---|
Severity level |
4 |
|||||||
Peak voltage |
Us |
-30 |
V |
|||||
Test voltage |
UP |
12 |
V |
|||||
Equivalent resistance |
RS |
40 |
W |
Operating state : Switched on
Additional specifications:
Pulse which rises when switching off inductive loads.
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tolerance |
Unit |
|
---|---|---|---|---|---|---|---|---|
Pulse rise time |
tr |
1 |
ms |
|||||
Pulse duration |
td |
2 |
ms |
Test pulse |
tr |
td |
Unit |
µs |
ms |
E1 |
1 |
2 |
E2 |
1 |
0.2 |
E3 |
0,05 |
- |
E4 |
||
E5 |
400 |
|
new |
Apart from the pulses E1 to E5, not standardized pulses can be defined, too. Since for these pulse forms no parameters can be defined yet, the description of theses pulses can be given in textual or in graphical form.
The characteristic test pulses are subdivided into interference emission grades via the pulse amplitude Us.
Characteristic pulses |
Admissible pulse amplitude U s in volts at interference emission grade (for 12/24V vehicle network voltage) |
|||
---|---|---|---|---|
IV |
III |
II |
I |
|
Pulse E1 |
-100 /-200 |
-75/-150 |
-50/-100 |
-25/-50 |
Pulse E2 |
+100 |
+ 75 |
+ 50 |
+ 25 |
Pulse E3 (a) |
-150/-200 |
-110/-140 |
-75/-70 |
-40/-35 |
Pulse E3 (b) |
+ 100 |
+ 75 |
+ 50 |
+25 |
Pulse E5 |
+120/200 |
+80/150 |
+50/100 |
+35/70 |
The severity levels depend on the vehicle network voltage. Further user-defined or in-house standard specific severity levels with corresponding voltages U s can be defined to given test pulses.
Apart from the pulse-shaped interference emission, a continuous interference emission can be defined, too. Generator ripple counts among these emissions. The interference emission of the generator ripple defines the max. admissible disturbance of the vehicle network by the generator. This is only required in case of the generators. In order to obtain reproducible results, the test installation should be described by the conduction lengths, the conduction cross sections, the generator revolutions, the generator outputs, the load resistance, the charge current, the battery type and the state of the battery. Within this test, the parameters load, range of revolutions, generator output etc. are submitted to complex interaction. Thus at present it is not possible to define parameters for this test with simple means. The description for this requirement will be given in a textual or in a graphical way.
10.4.2.2 | Test in vehicle |
An interference emission is an interference emitted by the DUT onto the vehicle network. When performing tests in vehicle, the built-in component is investigated. The interferences in the wiring harness will be observed. The following specifications can be given for an interference emission test.
Test pulse Characteristic test pulses defined in [Test pulses for the description of the interference emission according to DIN 40839 part 1] can be chosen. If the test pulse is described by detailed parameters, an adaptation of the parameter values corresponding to the test pulse is possible, just as during the laboratory tests. |
Severity level and corresponding peak voltage for the test pulse Severity levels defined in [Determination of interferences emission grades for characteristic pulses via admissible pulse amplitudes according to DIN 40839 part 1] can be chosen. The specification of the severity level is only required in case of standard pulses. |
Vehicle network voltage applied during the test. It will only be defined if it deviates from the standard test voltage. |
Additional specifications (<add-info>) Apart from the a.m. specifications, it is always possible to give additional specifications for a test. These include, e.g., a test temperature which differs from general specifications, the test set-up and further specifications which have not been defined yet (see Concepts of the MSR application profile V1.x.x). |
Example for content:
See example in chapter Laboratory tests.
10.5 |
Interferences by radiation |
The description of the requirements for interferences by radiation is performed in compliance with [Standard: DIN 40 839-4 / Relevant Position: all]. It includes requirements and tests in order to guarantee electromagnetic compatibility (EMC) of electronic components with respect to interferences which can couple into power supply conductions and signal conductions and/or into electronic vehicle units.
The a.m. standard describes the measurement of electromagnetic fields, the test set-up; furthermore it gives advice concerning limit values (frequency range and field strength).
Figure 42: Structure of interferences by radiation
10.5.1 | Measuring methods |
The measuring method describes the test devices with which the DUT is tested regarding EMC. A measuring method is described by a denomination and the description of the method.
Figure 43: Structure of the measuring method
Example for content:
Measuring method: TEM cell
Measuring equipment: TEM cell
Additional specifications to the measuring equipment:
Figure 44: Measuring set-up
for interference radiation in the TEM cell
Additionally, further user-defined and in-house standard specific measuring methods can be specified.
10.5.2 | Interference strength level |
The interference strength level is specified (as defined in the definition, see [Interference
strength levels during the measurement in the stripline or in the TEM cell .]). The corresponding field strength can be taken from the respective standard.
Figure 45: Structure of interference strength level
During the measurements in the stripline and in the TEM cell the given function states have to be observed up to the following limit values for field strength, which are determined according to frequency band, DUT and measuring method. The limit values are effective values of the unmodulated carrier.
Example for content:
Interference strength level 1 Measuring method: TEM cell. [Standard: (Assignment) / Relevant Position: all])
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Field strength |
E |
25 |
V/m |
Interference strength level 2 Measuring method: TEM cell
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Field strength |
E |
50 |
V/m |
Interference strength level 3 Measuring method: TEM cell
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Field strength |
E |
100 |
V/m |
During the measurements with current supply, the given function states have to be observed up to the following limit values for power on the wiring harness, which are determined according to frequency band and DUT. The limit values are valid for the unmodulated carrier.
Example for content:
Interference strength level 1 Measuring method: Current supply
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Power CW signal |
P |
20 |
dBm |
Interference strength level 2 Measuring method: Current supply
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Power CW signal |
P |
25 |
dBm |
Interference strength 3 Measuring method: Current supply
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Power CW signal |
P |
30 |
dBm |
Additionally, further user-defined or in-house standard specific interference strength levels can be specified.
10.5.3 | Frequency band, step width and dwell time |
A frequency band is a frequency range with a denomination.
Statements concerning step width and dwell time can optionally be specified ( see also DIN 40 839-4).
The DUT can be tested in different frequency ranges with corresponding requirements. The frequency bands can be specified including the relative or the absolute step width Df and the dwell time during the test (as given in the definition Representation
example for frequency bands (I)).
Figure 46: Structure of a frequency band
Example for content:
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Frequency range |
f |
1 |
10 |
MHz |
||||
Step width |
s |
1 |
MHz |
|||||
Dwell time |
t |
2 |
sec |
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Frequency range |
f |
10 |
30 |
MHz |
||||
Step width |
s |
1 |
MHz |
|||||
Dwell time |
t |
2 |
sec |
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Frequency range |
f |
30 |
80 |
MHz |
||||
Step width |
s |
1 |
MHz |
|||||
Dwell time |
t |
2 |
sec |
Additionally, further user-defined or in-house standard specific frequency bands can be created.
10.5.4 | Modulation |
The modulation is defined in DIN 40 839-4. The following data are necessary for a complete description:
Figure 47: Structure of modulation
Example for content:
Modulation: 80% 1kHz Modulations type: AM
Denomination |
Abbreviation |
Min |
Type |
Max |
Abs |
Tol |
Unit |
|
---|---|---|---|---|---|---|---|---|
Modulation level |
m |
80 |
% |
|||||
Modulation frequency |
f |
1 |
kHz |
10.5.5 | Laboratory tests |
Within the test in laboratory, the interference strength of the DUT with respect to interferences by radiation is tested. In case of an interference strength test, the behaviour of the DUT is tested by submitting it to different field strengths. The following specifications can be made for an interference strength test:
Apart from AM, also sampling and FM can be defined.
Function state (<function-state-ref>) The assignment of a function state to the test is accomplished by a code letter (A...E). |
Fault description (<failure-desc>) The failure mode of the system will be described in textual form, in addition to the function state (if it is not equal to A). |
Measuring method |
Interference strength level |
Frequency band |
Modulation |
Operating states |
Function state |
Fault description |
|
---|---|---|---|---|---|---|---|
TEM cell |
5 |
I |
80% 1kHz |
Idle running Full load |
A |
||
TEM cell |
4 |
II III |
80% 1kHz |
Idle running Full load |
A |
||
TEM cell |
3 |
IV V |
80% 1kHz |
Idle running Full load |
A |
Here, for every measuring method, the test set-up and the settings of measuring instruments can be described by means of text, tables and graphics.
10.5.6 | Test in vehicle |
When performing tests in vehicle the built-in component will be exposed to interferences by radiation. Following specifications can be made to describe the test:
Fault description (<failure-desc>) The failure mode of the system will be described in textual form, in addition to the function state (if it is not equal to A). |
Example for content:
See chapter Interferences by radiation.
10.5.7 | Additional measurements |
For technical reasons, not all types of influence can be covered, neither in laboratory nor in the absorber lined chamber. For acceptance investigations, additional vehicle tests can be necessary, e.g.:
Measurements in front of medium wave transmitter radio stations (e.g. Europawelle Saar Hausweiler) |
Measurements in front of short-wave high-power transmitter radio stations |
Measurements with portable radio sets |
Since the requirements differ a lot from each other and depend on the utilization possibilities of the respective type of vehicle, here the description of this requirement is not specified in more detail.
The following specifications, e.g., could be included in additional measurements:
Frequency range, step width, power, modulation,... |
Test installations for mobile telephones (C-network, D-network, E-network),... |
Operating state, function state, fault description,... |
etc. |
Structure:
Figure 50: Structure of additional measurements
10.6 |
Interference suppression |
The reason for interference suppression is the possible occurrence of electrical interferences in vehicle networks originated by various consumers, which may interfere onto radio devices in a conduction-guided way or by radiation. A distinction is made between long-distance and short-distance interferences.
Long-distance interferences (<remote-radio-inter>) are interferences (coming from the vehicle) of radio devices outside the vehicle.
Short-distance interferences (<short-inter-supp>) are interferences which affect radio devices mounted and operated inside the vehicle.
The requirements to interference suppression are described according to [Standard: DIN VDE 0879-1 / Relevant Position: 3] and [Standard: DIN 57879-1 / Relevant Position: 3].
Figure 51: Structure of interference supression
10.6.1 | Short-distance interference suppression |
Short-distance interference is a high-frequent interference of the radio reception; it occurs, when undesirable electromagnetic oscillations in the high-frequent reception channel of a radio reception antenna system or of a radio receiver, are received together with the useful signal via the antenna, or, the antenna input at the device, and affect the reproduction of the useful signal in a perceptible way.
Short-distance interferences can be conduction-guided or received by the vehicle's own antenna. For the conduction-guided interferences, a degree of suppression concerning the frequency ranges long wave, medium wave, short wave and ultra short wave is required. For interferences received via antenna, the admissible interference voltage levels are given regarding the reception ranges (long wave - ultra-short wave and portable radio sets). A difference is made between wide-band interference sources and narrow-band interference sources.
Figure 52: Structure of short-distance interference
suppression
10.6.1.1 | Laboratory tests |
When performing short-distance interference tests in laboratories, the output interferences of a component are investigated.
The following specifications can be made for laboratory tests.
Measuring method The measuring method describes the measuring equipment applied to the DUT regarding its interference emission. There are two typical measuring methods:
|
Measuring equipment At this place, the used measuring equipment can be described. Typical measuring equipment are, e.g., measuring receiver and spectrum analyser. The exact documentation of the setting of the measuring equipment should be made after the test set-up. |
Measuring band width
|
Frequency band The frequency band can be designated here (e.g. long wave, medium wave, short wave, L, M, ...) |
Frequency range Specification of the frequency range. |
Interference suppression level The interference suppression level defines a value for the maximum interference voltage (see (Interference suppression levels)). |
Operating state The operating state defines the state of the system at which the test is performed. If the test is to be performed with various operating states, these can be grouped. |
Additional specifications Apart from the a.m. specifications, it is always possible to give additional specifications for a test. |
Example for content:
The following table shows an example for the description of the narrow-band interference. The values have partially been taken from [Standard: (Interference suppression levels) / Relevant Position: Part 3].
Measuring method |
Measuring bandwidth |
Radio frequency band |
Interference suppression level |
Operating states |
|
---|---|---|---|---|---|
Artificial network |
Broadband |
LW |
5 |
Idle running Full load |
|
Artificial network |
Broadband |
MW KW |
4 |
Idle running Full load |
|
Artificial network |
Broadband |
UKW |
3 |
Idle running Full load |
Structure of the measuring method
See [Laboratory tests]
Example for content:
Measuring method: Artificial network
Measuring device: Artificial network
Additional specifications for the measuring device:
Assembly and ground arrangement in the vehicle have to be simulated.
The maximum interference voltage has to be identified by modifying load and the number of revolutions.
Figure 54: Measuring set-up for
measuring a consumer
1. Voltage supply
2. Artificial network; casing electrically connected to part 5
3. Interference measuring receiver; 50 W - Direct impedance
4. Measuring object in mounting position
5. Sheet metal plate; minimum dimensions (width*height in mm): 1000*400
Thickness (in mm): 1.0 (+/- 0.2)
10.6.1.2 | test in vehicle |
<short-inter-supp-vehicle-test>
For the vehicle test, the vehicle will be positioned in a shielded room (nevertheless, measurements at open air are possible, too). The connection of the measuring receiver is made at the artificial radio at the radio mounting place.
For measurements inside the vehicle, the antennas and mounting places which are used in the production series, should be utilized. Regarding an interference-free radio reception inside the vehicle, the distance between useful signal and interference signal should be sufficiently high at the end of the antenna cable.
During the vehicle test, a maximum interference voltage will be given, which should not be exceeded at the end of the antenna cable which is closed with a resistance.
Voltage characteristics represents possible requirements. The valid values can be gathered from the respective standard, or can be determined in concordance with the EMC department.
Measuring methods The measuring method describes the test equipment with which the DUT is tested regarding its interference emission. There are two typical measuring methods:
Measuring device Here, the used measuring equipment can be described. Typical measuring equipment are, e.g., measuring receiver and spectrum analyser. The exact description of the setting of the measuring equipment should be documented after the test set-up. |
Measuring band width
|
Frequency band The frequency band can be designated here (e.g. long wave, medium wave, short wave, L, M, ...) |
Frequency range Specification of the frequency range. |
Interference suppression level The interference suppression level defines a value for the maximum interference voltage (see (Interference suppression levels)). |
Operating state The operating state defines the state of the system at which the test is performed. If the test is to be performed with various operating states, these can be grouped. |
Additional specifications Apart from the a.m. specifications, it is always possible to give additional specifications for a test. |
Structure of a vehicle test:
See Structure of a laboratory test
Measuring method |
Measuring band width |
Radio frequency band |
Interference suppression level |
Operating states |
|
---|---|---|---|---|---|
Artificial network |
Broadband |
LW |
5 |
Idle running Full load |
2 |
Artificial network |
Broadband |
MW KW |
4 |
Idle running Full load |
2 |
Artificial network |
Broadband |
UKW |
3 |
Idle running Full load |
1 |
1. | Concluding subjective assessment of the interference suppression of ultra-high frequency range in open-air: The interference should not be heard in the entire frequency range, station finding should not lock. |
2. | Concluding subjective assessment of the interference suppression of long wave, medium wave and short wave range in open-air: Radio stations which can be received well should be free of interferences. |
Structure of the device description "Open air":
See [Short-distance interference suppression].
10.6.2 | Long-distance interference suppression |
A long-distance interference is an interference of a radio device outside the vehicle generated by a vehicle. This is always a high-frequent interference energy radiated by the vehicle.
The standards [Standard: ECE 10 / Relevant Position: all] or [Standard: VDE 879-1 / Relevant Position: all] determine limit values for the maximum admissible radio interference field strength. Furthermore, they define all other specifications, such as antenna, measuring equipment, operation modes, test amount etc.
The requirements in the performance specification should be described by means of text, tables and graphics; existing standards should be mentioned.
Figure 55: Structure of long-distance interference
suppression
10.7 |
ESD |
Electrostatic discharge (ESD) is based upon the charge of two insulating materials by friction. If the charged object comes near to a conducting object, the potential discharges by a spark that goes over to that conductor. The very fast compensating currents and the electromagnetic fields which are generated by this, are able to permanently damage electronic components.
The "human-body model" is used for testing the ESD strength of electronic components. It simulates the discharge of a human being with the capacitance C via his skin with the resistance R. For the area of vehicle electronics, the standard [Standard: ISO/CD 10605 / Relevant Position: all] can be applied. ESD requirements can be defined with the following specifications:
Test plan, Test set-up, Operating states, fault criteria, fault description, laboratory tests, and inside or outside the vehicle.
Figure 56: Structure of ESD
10.8 |
EMC design |
Design requirements and constructive measures in order to guarantee electromagnetic compatibility of electrical and electronic components early in time are discussed in the EMC design.
Figure 57: Structure of EMC design
10.8.1 | Conduction types and conduction arrangements |
<kind-wire-arrangement-wiring>
During the design of the wiring network, the electrical leads and the connection techniques can be given, or defined, according to their function in the vehicle.
Figure 58: Structure of conduction types and conduction
arrangements
Example for content:
Conductions without EMC functions: Unshielded single conductions and multiple conductions, flat ribbon conductions, ground plug-in connections. |
Conductions with EMC functions (e.g. signal conductions): twisted conductions, shielded conductions, twisted and shielded conductions, coaxial conductions, screwed ground connections. |
Furthermore, specifications concerning conduction arrangements can be made, in order to avoid electromagnetic radiation and coupling-in of interferences, e.g.:
Arrangement near ground surfaces |
Extra ground wires |
Parallel arrangement of inward and outward conductors |
Separate conduction of signal conductors and power supply conductors |
10.8.2 | Signal waves on vehicle network |
<signal-form-vehicle-electronic>
Within the transmission of data and electrical power via the vehicle network, these signals often are in a pulsed, periodic form. In order to reduce the radiation originated by these signals, general marginal conditions concerning their rise and drop times can be defined.
The signal characteristics will be defined generally for all interfaces. Furthermore, they can be defined contrary to this specification in the description of the interfaces for every connection. The signal characteristics can be defined by the parameters maximum voltage alteration and/or maximum current alteration.
Figure 59: Structure of signal waves on vehicle network
Denomination |
Abbreviation |
Min |
Type |
Max |
Tolerance |
Unit |
||
---|---|---|---|---|---|---|---|---|
Voltage change |
dU/dt |
100 |
V/ms |
|||||
Current change |
dI/dt |
10 |
A/ms |
10.8.3 | Ground concept |
The ground concept describes EMC measures with respect to ground conductions, ground layout, ground connection points in the system and inside the vehicle. The description of the requirements can be given in textual or in graphical form.
Figure 60: Structure of the ground concept
10.8.4 | Vehicle antennas |
Here, descriptions concerning broadcast receiving antennas and mobile radio antennas can be inserted.
The description of the requirements can be given in textual or in graphical form.
Figure 61: Structure of vehicle antennas
10.8.5 | EMC hardware measures |
The hardware measures describe means to improve EMC which can be realized with the use of hardware. Among these are, e.g.:
Filtration and protection wiring of inputs and outputs and supply conductions |
Shielding measures |
Printed circuit board layout |
Integration of anti-interference capacitors |
Influence of the different modes of operation (e.g. 2-wire-CAN) |
Selection of quartzes |
others |
For the selection of quartzes, the requirements can be defined as shown in Representation
example for forbidden frequency ranges for the use as oscillating circuit
frequency, data transmission frequency or working frequency.
Figure 62: Structure of EMC hardware measures
Frequency |
Distance |
Function |
4.6 MHz |
50 kHz |
Duplex distance in the 2m band |
5.0 MHz |
+ 50 kHz |
Duplex distance in the 70 cm band |
5.5 MHz |
+ 50 kHz |
TV-picture-sound carrier distance |
9.8 MHz |
+ 50 kHz |
Duplex distance in the 4m band |
10.0 MHz |
+ 50 kHz |
Duplex distance in the 2m band |
10.7 MHz |
+ 50 kHz |
Intermediate frequencies in case of wireless equipments, radio sets |
21.4 MHz |
+ 50 kHz |
Intermediate frequencies in case of wireless equipments |
45.0 MHz |
+ 50 kHz |
Duplex |
auto-defined |
auto-defined |
auto-definable frequencies |
The description of the requirements can be given in textual or in graphical form.
10.8.6 | EMC software measures |
Here, EMC software measures are represented (e.g. filtration of signals realized in software, temporary deactivation of single circuit components). The description of the requirements can be given in textual or in graphical form.
Figure 63: Structure of EMC software measures
10.9 |
Further properties |
Further properties are properties which ought to be mentioned in the topic Electrical compatibility, but which cannot be expressed thematically in any of the subdivision points mentioned above.
Figure 64: Structure of additional specifications
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